International Journal of Scientific Research and Engineering Development

International Journal of Scientific Research and Engineering Development


( International Peer Reviewed Open Access Journal ) ISSN [ Online ] : 2581 - 7175

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Embedded applications focused on JTAG Interface on Fault Injection Technology



    International Journal of Scientific Research and Engineering Development (IJSRED)

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Published Issue : Volume-4 Issue-1
Year of Publication : 2021
Unique Identification Number : IJSRED-V4I1P67
Authors : K. Durgalakshmi
: Click Here | DOI : https://doi.org/10.5281/zenodo.4536680


Abstract :

The injection and testing of faults is an integral PHM form. With the architectures and functions of PHM and integrated modular avionics systems, defective injection often becomes more complex and traditional "PLUG, sample and adaptation plate" methods are difficult to use (IMA). Engineering systems also provide a software-based fault injection to monitor and operation bottle. This research aims to solve the problem of using software defect injections to validate testing through an error injection mechanism based on the interface of the Joint Test Action Group (JTAG). The technique is based on research parameters and takes the modularization and integration patterns of avionics into account and takes into consideration aspects of JTAG border scanning technology. Hardware defects can be injected in a non-contact manner using boundary scanning techniques and chip debugging. The exact and manageable defects of embedded chips/functions which meet simulation error and effect/time requirements can then be achieved. Thus it is possible to tackle problems with equipment-based injection defect architecture systems and to check new airborne PHM tests and integrated aeroplane testing equipment so that test index and PHM functions effectively help and ensure performance..